108 lines
2.5 KiB
C
108 lines
2.5 KiB
C
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/*
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*******************************************************************************
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* *
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* COPYRIGHT: *
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* (C) Copyright International Business Machines Corporation, 1998 *
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* Licensed Material - Program-Property of IBM - All Rights Reserved. *
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* US Government Users Restricted Rights - Use, duplication, or disclosure *
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* restricted by GSA ADP Schedule Contract with IBM Corp. *
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* *
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*******************************************************************************
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*
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* File ieeetest.h
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*
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* Modification History:
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*
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* Date Name Description
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* 08/21/98 stephen Creation.
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*******************************************************************************
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*/
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#ifndef _IEEETEST
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#define _IEEETEST
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int main(int argc, char **argv);
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void usage(const char *execName);
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// Very simple class for testing IEEE compliance
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class IEEETest
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{
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public:
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// additive constants for flags
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enum EModeFlags {
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kNone = 0x00,
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kVerboseMode = 0x01
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};
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IEEETest(int flags = kNone);
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~IEEETest();
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// method returns the number of errors
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int run();
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private:
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// utility function for running a test function
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int runTest(const char *testName,
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int (IEEETest::*testFunc)(void));
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// the actual tests; methods return the number of errors
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int testNaN();
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int testPositiveInfinity();
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int testNegativeInfinity();
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int testZero();
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// subtests of testNaN
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int testIsNaN();
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int NaNGT();
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int NaNLT();
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int NaNGTE();
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int NaNLTE();
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int NaNE();
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int NaNNE();
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// logging utilities
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int getTestLevel() const;
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void increaseTestLevel();
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void decreaseTestLevel();
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IEEETest& log(char c);
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IEEETest& log(const char *s);
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IEEETest& log(int i);
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IEEETest& log(long l);
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IEEETest& log(double d);
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IEEETest& logln();
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IEEETest& err(char c);
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IEEETest& err(const char *s);
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IEEETest& err(int i);
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IEEETest& err(long l);
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IEEETest& err(double d);
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IEEETest& errln();
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// data members
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int mFlags; // flags - only verbose for now
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int mTestLevel; // indent level
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short mNeedLogIndent;
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short mNeedErrIndent;
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};
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inline int
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IEEETest::getTestLevel() const
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{ return mTestLevel; }
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inline void
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IEEETest::increaseTestLevel()
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{ mTestLevel++; }
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inline void
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IEEETest::decreaseTestLevel()
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{ mTestLevel--; }
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#endif
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//eof
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