v8/test
bmeurer@chromium.org a4c072ed47 Fix a crash when generating forward jumps to labels at very high assembly offsets
The first jump to a specific label was marked as jump to absolute
position -4. This value was stored in the assembly as a branch to a
offset (-4 - (instruction offset + 8)). The offset is only 24 bit
long on ARM. Thus instruction offsets higher than 2^23 - 12 would overflow
the offset.

Fix by denoting the first jump to a label by storing the jump
instruction location as the target. This will result in offset of -8,
which of course always fits in the branch instruction.

BUG=2736
TEST=cctest/test-assembler-arm/17
R=bmeurer@chromium.org, svenpanne@chromium.org

Review URL: https://codereview.chromium.org/17116006

Patch from Kimmo Kinnunen <kkinnunen@nvidia.com>.

git-svn-id: http://v8.googlecode.com/svn/branches/bleeding_edge@15997 ce2b1a6d-e550-0410-aec6-3dcde31c8c00
2013-08-01 08:13:08 +00:00
..
cctest Fix a crash when generating forward jumps to labels at very high assembly offsets 2013-08-01 08:13:08 +00:00
intl Import intl test suite from v8-i18n project 2013-07-10 10:49:04 +00:00
message Migrate blink tests that are not relevant to blink into a new V8 test suite called 'blink'. 2013-06-26 14:23:30 +00:00
mjsunit Mark maps as unstable if their instances potentially transition away. 2013-07-30 16:33:58 +00:00
mozilla Remove SCons related files 2013-04-18 11:01:14 +00:00
preparser Remove SCons related files 2013-04-18 11:01:14 +00:00
test262 Fix bogus arguments length check in StringLocaleCompare. 2013-05-10 13:50:10 +00:00
webkit Skip recently added test associated with bug id 2013-07-31 06:36:29 +00:00